Precession Electron Diffraction Assisted Orientation Mapping in the Transmission Electron Microscope
نویسندگان
چکیده
منابع مشابه
Precession Electron Diffraction in the Transmission Electron Microscope: electron crystallography and orientational mapping
Precession electron diffraction (PED) is a hollow cone non-stationary illumination technique for electron diffraction pattern collection under quasikinematical conditions (as in X-ray Diffraction), which enables “ab-initio” solving of crystalline structures of nanocrystals. The PED technique is recently used in TEM instruments of voltages 100 to 300 kV to turn them into true electron diffractom...
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Three-dimensional orientation mapping in the transmission electron microscope.
Over the past decade, efforts have been made to develop nondestructive techniques for three-dimensional (3D) grain-orientation mapping in crystalline materials. 3D x-ray diffraction microscopy and differential-aperture x-ray microscopy can now be used to generate 3D orientation maps with a spatial resolution of 200 nanometers (nm). We describe here a nondestructive technique that enables 3D ori...
متن کاملAberration-corrected precession electron diffraction
Precession electron diffraction (PED) is a promising technique for collecting high quality diffraction patterns for rapid nanoscale structural characterization [1]. It is able to reduce dynamical scattering effects, improving the interpretability of diffraction intensities over those obtained by conventional electron diffraction techniques. When used on a microscope that can produce a fine prob...
متن کاملOn the alignment for precession electron diffraction.
Precession electron diffraction has seen a fast increase in its adoption as a technique for solving crystallographic structures as well as an alternative to conventional selected-area and converged-beam diffraction methods. One of the key issues of precession is the pivot point alignment, as a stationary apparent beam does not guarantee a fixed pivot point. A large precession tilt angle, along ...
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ژورنال
عنوان ژورنال: Materials Science Forum
سال: 2010
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/msf.644.1